498 Каталог MAHR 2014 Измерительные инструменты и приборы для линейно-угловых измерений Стр.15-37

Каталог MAHR 2014 Измерительные инструменты и приборы Стр. 15-37 0498 ENG Lab2u

MarSurf Surface Measuring Instruments and Systems 15-37 Mahr MarSurf Data Overview XC 2 XC 20 Parameters Probes Drive unit Traversing length Measuring range Profile resolution Measuring force (in Z) Dimensions (L x B x H) Weight of measuring station Power supply MarSurf XC 2 XC 20 Radii angles distances coordinates fitting in of regression straight lines best-fit circles circle sections. Defining points circles and circle sections and much more. Multiple measurements double contours DXF import (only XC 20) 350 mm probe arms 175 mm probe arms complete with probe stylus tips MarSurf CD 120 MarSurf PCV 200 (only XC 20) 1 mm to 120 mm 1 mm to 200 mm (only XC 20) 25 mm with 350 mm probe arm 350 mm probe arm 05 pm; 175 mm probe arm 025 mm 1 mN to 120 mN variably adjustable Approx. 700 mm x 550 mm x 720 mm (of compl. meas. stand ST 500) Approx. 140 kg (with ST 500 meas. stand) 230 V (or 115 V possible) MarSurf WM 100 CWM 100. Data Overview Measuring principle Measuring range WM 100 Interferometric white light-interferometric light source (WLI) high-performance-LED 505 nm Sensor unit can be manually moved over 200 mm manually in Z Object table can be manually moved in X and Y Interferometer white light-interferometric Measuring range (WLI) up to 100 pm (vertically) CWM 100 Interferometric white light-interferometric and confocal light source (KFM and WLI) high- performance-LED 505 nm Sensor unit movable 100 mm in Z CNC-controllable object table movable 100 mm in X and Y CNC-controllable Interferometer white light-interferometer light source (WLI) up to 4 mm (depending upon lens) Confocal microscope Measuring range (KFM) up to over 800 pm (depending upon resolution in Z and lens) MarSurf FP 40 180. Data Overview MarSurf FP 40 MarSurf FP 180 Planar MarSurf FP 40 MarSurf FP 180 Volumen Area of use 2.5D objects Complex 3D objects Measuring concept Phasogrammetry fringe projection Multi-view fringe projection Measuring field 0 40 mm 0 180 mm 0 40 mm 0 180 mm High measuring volume 10 mm 35 mm 15 mm 50 mm Observation field 0 40 mm 0 180 mm 0 40 mm 0 180 mm Measuring uncertainty 2 pm 5 pm 5 pm 25 pm Measuring point distance 45 pm to 50 pm 150 pm to 200 pm 25 pm 80 pm Partial views 1 N:1-24 Measuring points per position (max.) 1.5 million N x 1.5 million Measuring time 30 s to 200 s N x (30 to 60)s Detectable inclination angle on the object Up to 40 Under cuts up to 110