482 Каталог MAHR 2007 Линейно-угловые средства измерений Измерительный инструмент Стр.19-6

Каталог MAHR 2007 Линейно-угловые средства измерений Стр. 19-6 0482 ENG Lab2u

MarVision Multisensor Technology from Mahr Chromatic White-Light Sensor (CWS) High-resolution point-based measurement Interferometric White-Light Sensor (IWS) Topography recording with maximum resolution A very high-resolution system is needed to measure with microaccuracy. Metrologically speaking glossy surfaces also represent a major chal lenge. In both cases the chromatic white-light sensor is ideal. Topographic recording of microstructures Digitization on glossy surfaces (e.g. glass polished metal) Digitization of transparent materials Measuring range of 300 m to 3 mm (0.012 in to 0.12 in) Working distance of 4.5 mm to 22 mm (0.18 in to 0.87 in) Resolution of up to 10 nm (0.4 in) This sensor technology is primarily used in electronics micromechanics optics and medical technology. Microlenses Ball grid arrays (BGA) Integrated circuits Medical implants Due to the use of the confocal principle measurements with this sensor are very robust. If both maximum precision and a high measuring speed are required the latest technology from Mahr is your only option. With the interferometric white-light sensor it is possible to record the entire topography of a surface in a single measuring run. The time-consuming and comparatively inaccurate scanning of individual contours is no longer necessary. This sensor's high precision can only be achieved using the OMS air bearing systems. Quick and precise recording of surface topographies Digitization of microstructures Resolution of up to 0.1 nm (0.004 in) This sensor technology is primarily used for testing surface structures. Contact-free roughness measurement Integrated circuits