431 Каталог MAHR 2007 Линейно-угловые средства измерений Измерительный инструмент Стр.16-15

Каталог MAHR 2007 Линейно-угловые средства измерений Стр. 16-15 0431 ENG Lab2u

MarSurf. Surface Measuring Instruments and Systems MarSurf XC 20 The new generation of contour measurement systems Description When it comes to contour evaluation MarSurf XC 20 is simply the best. What started over 30 years ago with the Conturograph - consisting of a drive unit and x-y plotter has today developed into a state-of-the-art contour measurement system with the very latest technology. This perfectly coordinated configuration of instruments meets the highest performance standards. Both the drive unit and the measuring stand are controlled and positioned using the reliable measurement and evaluation software. Features In addition to the functions of the MarSurf XC 2 entry-level unit MarSurf XC 20 also provides additional features Notes on the operating sequence can be displayed Interactive control elements support evaluations and automatic operating sequences Measurement of upper and lower contours with "twin stylus probe"; these contours can also be evaluated in relation to each other Creation of profile sections with evaluations of different parameters for each section Segmented measurement across obstacles such as bores or steep sides is possible Import and export of DXF files for nominal actual comparison PCV 200 drive unit with patented probe arm mount allows tool-free reproducible changeover of probe arms Flexibility measuring station thanks to patented probe system Manual freely variable tracing forces also support flexibility Synthetic creation of nominal profiles from straight lines and arcs Straightforward comparison of nominal and actual profiles. Several ranges can be defined within a measured profile and each of these ranges can be assigned a different tolerance and different evaluations Versions By combining the MarSurf XC 20 software with the high-precision LD 120 drive and probe system and the ST 500 or ST 750 measuring stand resolutions in the nm range can be achieved thereby allowing contour and roughness depth to be determined in a single measuring run. Additional functions such as qs-STAT-based data export or evaluation of dominant waviness are further optional extras.